物理學實驗/XR4 X射線專家級基本設備-濠福有限公司

Products產品介紹

XR4 X射線專家級基本設備

XR4 X射線專家級基本設備 (09057-99)

ㄧ套專門為教育用途與師生安全考量所設計的X-ray儀器

根據德國聯邦輻射防護辦公室（Bundesamt für Strahlenschutz，BFS）的型別批准的學校/全保護裝置

具有X射線管快速更換技術的X射線單元。可選購多項相關應用設備完成物理.化學.生物共59項實驗

1. X射線固態物理學
2. X射線特徵研究
3. X射線結構分析
4. X射線材料研究
5. X射線成像研究
6. X射線劑量測定
7. X射線電腦斷層掃描

產品介紹
產品影片

微處理器控制的基本單元，有兩個獨立的門位置安全電路和兩個獨立的門鎖系統監控電路
四種不同的X射線管（Fe、Cu、Mo和W）可以插入，並在操作期間保持可見
透過具有可變計數器管電壓（0...600 V）和整合揚聲器的整合蓋格-米勒計數管連線來確定X射線強度
TFT彩色顯示屏（尺寸4,3英寸（95x54毫米），16位，56.536色，480x272畫素），用於手動控制裝置
真彩色線形內部LED照明系統
高壓0.0...35.0千伏，步進0.1千伏
發射電流0.0...1.0mA，步進0.01 mA
外殼（毫米）：446（深）x 562（高）x 682（寬）
實驗室（毫米）：440（寬）x 345（高）x 354（深）
連線：110/240 V~，50/60 Hz
功耗：200 VA
品質：55公斤
透過USB 2.0控制PC

本套X-ray設備搭配相關附件, 可做實驗如下列：

Beam hardening and metal artefacts

Optimization of the CT scan quality

Alignment of the camera

Hounsfield units

Duane-Hunt displacement law

Energy-dispersive measurements of K- and L-absorption edges

Principles of CT scan

Principles of Digital X-ray Imaging

Computed tomography

Determination of the lattice constants of a monocrystal

Principles of resolution and detail detectability

Compton effect - energy-dispersive direct measurement

Principles of X-ray attenuation and contrast

Principles of beam intensity

X-ray fluorescence spectroscopy – layer thickness determination

Quantitative X-ray fluorescence analysis of solutions

Qualitative X-ray fluorescence analysis of solutions

Inherent fluorescence radiation of the X-ray energy detector

X-ray energy spectroscopy - calibration of the X-ray energy detector

Energy resolution of the X-ray energy detector

Qualitative X-ray fluorescence analysis of alloyed materials

Quantitative X-ray fluorescence analysis of alloyed materials

Qualitative X-ray fluorescence analysis of powder samples

Qualitative X-ray fluorescence analysis of ore samples

Qualitative X-ray fluorescence spectroscopy of metals - Moseley's law

Debye-Scherrer diffraction measurements for the examination of the texture of rolled sheets

Qualitative examination of the absorption of X-rays

Diffraction measurements to determine the intensity of Debye-Scherrer reflexes using a cubic powder sample

Debye-Scherrer diffraction patterns of powder samples with a tetragonal lattice structure

Characteristic X-rays of tungsten

Debye-Scherrer diffractions pattern of powder samples with a diamond structure (according to Bragg-Brentano)

Debye-Scherrer diffraction patterns of powder samples with three cubic Bravais lattices

Determination of length and position of an object which cannot be seen

Debye-Scherrer diffraction patterns of powder samples with a hexagonal lattice structure

Debye-Scherrer diffraction patterns with a cubic powder sample

X-ray investigation of crystal structures / Laue method with digital X-ray image sensor(XRIS)

Contrast medium experiment with a blood vessel model

Compton scattering of X-rays

X-ray investigation of cubic crystal structures / Debye-Scherrer powder method

X-ray investigation of hexagonal crystal structures / Debye-Scherrer powder method

K and L absorption edges of X-rays / Moseley's law and the Rydberg constant

X-ray investigation of crystal structures / Laue method

Examination of the structure of NaCl monocrystals with different orientations

Absorption of X-rays

Monochromatisation of copper X-rays

Characteristic X-ray lines of different anode materials / Moseley's law

Duane-Hunt displacement law and Planck's "quantum of action"

K alpha doublet splitting of iron X-rays / fine structure

K alpha double splitting of molybdenum X-rays / fine structure

Monochromatisation of molybdenum X-rays

The intensity of characteristic X-rays as a function of the anode current and anode voltage

Characteristic X-rays of iron

Characteristic X-rays of molybdenum

Radiographic examination of objects

Characteristic X-rays of copper

Ionizing effect of X-radiation

Counter tube characteristics

X-ray dosimetry